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Thin Film XRD Workshop

Advanced characterisation by high-resolution X-ray diffraction

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A focused afternoon for researchers and students working on thin films, epitaxial layers and coatings - from out-of-plane, in-plane and rocking curve fundamentals through to reflectivity and reciprocal space mapping, ending with a live measurement on the Rigaku SmartLab 9 kW HR-XRD.

 

 

Details

Start: 29 September 2026
1:00 pm
End: 29 September 2026
4:00 pm
Nanyang Technological University

School of Physical and Mathematical Sciences (SPMS), Level 3, MAS EC Room 1, SPMS-MAS-03-06

21 Nanyang Link
637371 Singapore
Singapore