Venue NTU Lecture Theatre 5 (NS2-02-07) FACTS@ABN (ABN-B4b-10) TELS Room
Organiser FACTS (Email : facts-outreach@ntu.edu.sg Tel/Fax : 65921813)
This short course introduces the use of x-ray spectroscopy for elemental analysis, in the scanning electron microscopes, x-ray florescence and the EPMA. This include concepts on how signals are emitted, detected and processed by hardware; spectra representation and the main differences between energy dispersive and wavelength dispersive systems This provides the necessary understanding for good data collection for microanalysis and requirements needed for sample preparation.
This short course is for users who have a need to conduct elemental analysis on their samples and is seeking appreciation on the means to do so appropriately.
Speaker:
Mr Lim Ming Pin, Alan
FACTS, NTU Singapore